Click for a
LaTeX/MiKTeX
Derived
DVI Version,
PS Version or/and
PDF Version of
the Patents
MS Word Version of the Patents
Abstract:
Quadricmeter is the instrument devised to identify (distinguish) and measure the various
parameters (axis, foci, latera recta, directrix, etc.,) completely characterizing the important
class of surfaces known as the quadratic surfaces. Quadratic surfaces (also known as quadrics)
include a wide range of commonly encountered surfaces including, cone, cylinder, ellipsoid,
elliptic cone, elliptic cylinder, elliptic hyperboloid, elliptic paraboloid, hyperbolic cylinder,
hyperbolic paraboloid, paraboloid, sphere, and spheroid. Quadricmeter is a generalized form of
the conventional spherometer and the lesser known cylindrometer (also known as the “Cylindro-Spherometer”).
With a conventional spherometer it was possible only to measure the radii of spherical surfaces.
Cylindrometer can measure the radii of curvature of a cylindrical surface in addition to the spherical
surface. In both the spherometer and the cylindrometer one assumes the surface to be either spherical
or cylindrical respectively. In the case of the quadricmeter, there are no such assumptions.
For Copies of Preprints and Additional Information: rohelakhan@yahoo.com
Back to Mainpage of Khan Sameen Ahmed Khan | Curriculum Vitae | Technical Writings | Patents: Conicmeter and Quadricmeter | Non-Technical Writings (Popular Writings) | Multilingual Electronic Translation |
© Last updated Friday, the 24 October 2008